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The complexity of hardware designs has increased over the years due to the rapid advancement of technology coupled with the need to support diverse and complex features. The increasing design complexity directly translates to difficulty in verifying functional behaviors as well as non-functional requirements. Simulation is the most widely used form of validation using both random and constrained-random test patterns. The random nature of test sequences can cover a vast majority of scenarios, however, it can introduce unacceptable overhead to cover all possible functional and non-functional scenarios. Directed tests are promising to cover the remaining corner cases and hard-to-detect scenarios. Manual development of directed tests can be time-consuming and error-prone. A promising avenue is to perform automated generation of directed tests. In this article, we provide a comprehensive survey of directed test generation techniques for hardware validation. Specifically, we first introduce the complexity of hardware verification to highlight the need for directed test generation. Next, we describe directed test generation using various automated techniques, including formal methods, concolic testing, and machine learning. Finally, we discuss how to effectively utilize the generated test patterns in different validation scenarios, including pre-silicon functional validation, post-silicon debug, as well as validation of non-functional requirements. 

Concolic testing is a scalable solution for automated generation of directed tests for validation of hardware designs. Unfortunately, concolic testing fails to cover complex corner cases such as hard-to-activate branches. In this article, we propose an incremental concolic testing technique to cover hard-to-activate branches in register-transfer level (RTL) models. We show that a complex branch condition can be viewed as a sequence of easy-to-activate events. We map the branch coverage problem to the coverage of a sequence of events. We propose an efficient algorithm to cover the sequence of events using concolic testing. Specifically, the test generated to activate the current event is used as the starting point to activate the next event in the sequence. Experimental results demonstrate that our approach can be used to generate directed tests to cover complex corner cases in RTL models while state-of-the-art methods fail to activate them. 

System-on-Chip (SoC) security is vital in designing trustworthy systems. Detecting and fixing a vulnerability in the early stages is easier and cost-effective. Assertion-based verification is widely used for functional validation of Register-Transfer Level (RTL) designs. Assertions can improve the controllability and observability that can lead to faster error detection and localization. Although assertions are widely used for functional validation of RTL models, there is limited effort in applying assertions to detect SoC security vulnerabilities. Specifically, a fundamental challenge in SoC security and trust validation is how to develop high-quality security assertions. In this article, we perform automated vulnerability analysis of RTL models to generate security assertions for six classes of vulnerabilities. Experimental results show that the generated security assertions can detect a wide variety of vulnerabilities. Our automated framework can drastically reduce the overall security validation effort compared to the manual development of security assertions. Automated generation of security assertions will enable assertion-based verification to be one of the most promising pre-silicon security sign-off solutions.